Abstract

Tukey’s chart uses a single observation to monitor the process mean, and it is suitable for monitoring of destructive testing data. Tukey’s chart adopts symmetrical control limits to monitor process, and it is insensitive to signal mean shifts when the monitoring variable follows a skew distribution. This study proposes Tukey’s chart with asymmetrical control limits (ACL-Tukey’s chart) to monitor process mean. A statistical measurement performed with ACL-Tukey’s chart, improves successfully, the ability in signaling shifts for monitoring of right-skew and left-skew populations. A real case of IC packaging is given to illustrate the practice procedure of ACL-Tukey’s chart and indicates that ACL-Tukey’s chart is suitable to monitor the industrial process.

Key words: Tukey’s control chart, destructive testing, skew distribution, IC packaging process, statistical process control.