October 2018

Deriving an expression for electron-reflection-coefficient at metal-semiconductor-interface of dye-sensitized solar cells

This work aims to derive an expression to describe the reflection coefficient of an escape electron from metal-semiconductor interface of DSSC.  The derivation was obtained by analytically solving electron diffusion equation with assumptions of steady state DSSC and negligible current flow at the outer most part of the film. The derived corrected Richardson-Dushman equation including a reflection of electron wave...

Author(s): Lurwan Garba