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Genetic analysis for yield
and its components in doubled haploid wheat
J. Ojaghi* and E. Akhundova
Department
of Biology, Faculty of Genetic and Darwinism, Baku State
University, Azerbaijan.
*Corresponding author. E-mail:
Javid_804@yahoo.com.
Tel: +99450-3455674.
Accepted 7
December, 2009 |
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The
inheritance of grain yield and its components (number of
spikelets per spike, number of tillers, number of grains per
spike, plant height) has been studied through a full diallel
cross of eight doubled haploid bread wheat. Generation mean
and variance analysis was carried out on P1, P2,
F1, F2, BC1 and BC2
generation of two crosses to complement the genetic
information from the diallel analysis. Regression analysis,
average of dominance and narrow sense heritability in both
experiments revealed additive type of gene action for number
of grains per spike and plant height and over dominant type
of gene effects for the rest of traits. Although different
types of epistasis interaction were found for different
trait and cross combination, duplicate dominant epistasis
only observed for number of spikelets per spike, number of
tillers and grain yield per plant. Correlation analysis of
dominant genes with the phenotype of the parents revealed
recessive gene control for number of tillers, while dominant
gene control proved to account for the rest of the traits
studied.
Key
words:
Doubled haploid wheat, gene effects, yield components,
diallel, generation mean analysis. |
